Specifies an absorber-lined shielded enclosure method for testing the immunity of electronic components. The device under test (DUT), together with the wiring harness (prototype or standard test harness), is subjected to an electromagnetic disturbance generated inside an absorber-lined shielded enclosure, with peripheral devices either inside or outside the enclosure. It is applicable only to disturbances from continuous narrowband electromagnetic fields.
Radiated electromagnetic fields are generated using antennas with a radio frequency (RF) energy source capable of producing the desired field strengths. A set of antennas and multiple RF amplifiers could be required to cover the range of test frequencies.
TRANSIENT TEST TECHNOLOGIES PTE LTD
61 KAKI BUKIT AVENUE 1 #02-40 SHUN LI INDUSTRIAL PARK SINGAPORE-417943