ISO11452-3 (Transverse electromagnetic (TEM) cell)
The TEM cell method has the major advantage of not radiating energy into the surrounding environment. The method can be used for testing either the immunity of a component with the field coupling to the wiring harness or the immunity of the component alone with minimum exposure to the wiring harness.
Specifies transverse electromagnetic (TEM) cell tests for determining the immunity of electronic components to electrical disturbances from narrowband radiated electromagnetic energy.
The device under test should be placed in the center of the cell on a dielectric equipment support. The device under test and the wiring harness may be positioned in either of two arrangements, depending on whether the exposure of the device under test and the wiring harness or that of the device alone is being tested.