ISO7637-3
CCC
CCC
CCC
This method involves using a capacitive clamp to inject fast pulses onto data or communication lines.
To evaluate the immunity of devices under test (DUTs) to transient pulses. These pulses simulate disturbances caused by the switching of inductive loads and relay contact bounce.
ICC
CCC
CCC
This method uses an inductive clamp to inject pulses onto the line.
To evaluate the immunity of devices under test (DUTs) to transient pulses. These pulses simulate disturbances caused by the switching of inductive loads and relay contact bounce.
DCC
CCC
DCC
This method directly couples the test pulses to the lines under test.
To evaluate the immunity of devices under test (DUTs) to transient pulses. These pulses simulate disturbances caused by the switching of inductive loads and relay contact bounce.